7.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted) (1)(2)
|
MIN |
MAX |
UNIT |
| VDD_IO |
Supply voltage for input(3) |
–0.3 |
3.6 |
V |
| VDD_CORE |
Supply voltage for digital(3) |
–0.3 |
3.6 |
V |
| VDD_PLL1 |
Supply voltage for PLL1(3) |
–0.3 |
3.6 |
V |
| VDD_PLL2CORE |
Supply voltage for PLL2 core |
–0.3 |
3.6 |
V |
| VDD_PLL2OSC |
Supply voltage for PLL2 OSC(3) |
–0.3 |
3.6 |
V |
| VDD_OSC |
Supply voltage for OSCout(3) |
–0.3 |
3.6 |
V |
| VDDO_x |
Supply voltage for CLKoutX |
–0.3 |
3.6 |
V |
| VIN_clk |
Input voltage for CLKinX and OSCin(3) |
–0.3 |
(VDD_IO + 0.3) |
V |
| VIN_gpio |
Input voltage for digital and status pins (CLKin_SEL, SCK, SDIO, SCS*, STATUSx, SYNC, RESETN) |
–0.3 |
2.1 |
V |
| TL |
Lead temperature (solder 4 s) |
|
+260 |
°C |
| TJ |
Junction temperature |
|
125 |
°C |
| IIN |
Input current |
|
20 |
mA |
| MSL |
Moisture sensitivity level |
|
3 |
|
| Tstg |
Storage temperature |
–65 |
150 |
°C |
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) Stresses in excess of the absolute maximum ratings can cause permanent or latent damage to the device. These are absolute stress ratings only. Functional operation of the device is only implied at these or any other conditions in excess of those given in the operation sections of the data sheet. Exposure to absolute maximum ratings for extended periods can adversely affect device reliability.
(3) Never to exceed 3.6 V.