SLVK225 August 2025 TPS7H5020-SEP
The purpose of this study was to characterize the effect of heavy-ion irradiation on the single-event effect (SEE) performance of the TPS7H5020-SEP radiation-tolerant, current mode, single-ended PWM controller with an integrated gate driver. Heavy-ions with LETEFF = 48MeV·cm2/mg were used for the SEE characterization campaign. Flux of 9.14 × 104 to 1.26 × 105 ions/(cm2×s) and fluences of ≈ 1x107 ions/cm2 per run were used for the characterization. The SEE results demonstrated that the TPS7H5020-SEP is free of destructive SEL and SEB at LETEFF = 48MeV·cm2/mg and across the full electrical specifications. Transients at LETEFF = 48MeV·cm2/mg were monitored and discussed CREME96-based worst week event-rate calculations for LEO(ISS) and GEO orbits for DSEE are presented for reference.