During the SEB/SEGR characterization, the device was tested at room temperature of approximately 25°C. The device was tested under both the enabled and disabled mode. For the SEB-OFF mode the device was disabled using the EN-pin by forcing 0V (using CH # 1 of a E36311A Keysight PS). During the SEB/SEGR testing with the device enabled/disabled, not a single input current event was observed.

The species used for the SEB testing was ¹⁰⁹Ag (TAMU) at 15MeV/nucleon and ¹⁰⁹Ag (KSEE) at 19.5 MeV/nucleon. For both ions an angle of 0° was used to achieve a LET_EFF of ≈ 48MeV·cm²/mg (for more details refer to Table 5-1). The kinetic energy in the vacuum for ¹⁰⁹Ag (TAMU) is 1.635GeV and ¹⁰⁹Ag (KSEE) is 2.125GeV. Flux of ≈ 9.67 × 10⁴ to 1.26 × 10⁵ ions/(cm²×s) and a fluence of ≈10⁷ ions/cm² per run was used. Run duration to achieve this fluence was ≈2 minutes. The 6 devices (same as used in SEL testing) were powered up and exposed to the heavy-ions using the maximum recommended bias conditions. No SEB/SEGR current events were observed during the 12 runs, indicating that the TPS7H5020-SEP is SEB/SEGR-free up to LET_EFF = 48MeV·cm²/mg and across the full electrical specifications.Table 8-4shows the SEB/SEGR test conditions and results.

Using the MFTF method described in Single-Event Effects (SEE) Confidence Interval Calculations application report, the upper-bound cross-section (using a 95% confidence level) is calculated as:

σ_SEB ≤ 3.07x 10^-8 cm²/device for LET_EFF = 75 MeV·cm²/mg and T = 25°C.