ZHCSGU8E June 2017 – August 2018 ISO1211 , ISO1212
PRODUCTION DATA.
請參考 PDF 數(shù)據(jù)表獲取器件具體的封裝圖。
Figure 11. Input Current and Voltage Threshold Test Circuit
Figure 12. Enable and Disable Propagation Delay Time Test Circuit and Waveform—Logic Low State
Figure 13. Enable and Disable Propagation Delay Time Test Circuit and Waveform—Logic High State