SFFSAN5 July 2025 UCC25661-Q1
The failure mode distribution estimation for the UCC25661x-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| Vout Regulation Issue | 29 |
| Degraded System Efficiency | 20 |
| Gate Driver Failure | 16 |
| Fault Detection Issue | 7 |
| Compromised HV Capability | 2 |
| No Effect | 26 |