SBOK096A February 2025 – March 2025 SN54SC8T164-SEP , SN54SC8T374-SEP , SN54SC8T574-SEP , SN54SC8T595-SEP
The purpose of this study was to characterize the effects of heavy-ion irradiation on the single-event latch-up (SEL) performance of the SN54SC8T595-SEP radiation-tolerant, 1.2V to 5.5V 8-bit shift registers with 3-state output and logic level shifter. SEE performance was verified at minimum (1.2V) and maximum (5.5V) operating conditions. Heavy-ions with an LETEFF of 50MeV-cm2/ mg were used to irradiate three production devices with a fluence of 1 × 107 ions / cm2. The results demonstrate that the SN54SC8T595-SEP is SEL-free up to LETEFF = 50MeV-cm2/ mg as 125°C. SET performance for the maximum operating voltage saw no excursions ≥ |1%|. The minimum voltage saw 1 excursion at |1%|, as shown and discussed in this report. CREME96-based worst week event-rate calculations for LEO(ISS) and GEO orbits for the SEL and SET are presented for reference.