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ZHCSHX1E March 2018 – August 2021 TMP1075

PRODUCTION DATA

8.5 Electrical Characteristics:TMP1075

at T_A = –55°C to +125°C and V+ = 1.7 V to 5.5 V (unless noted); typical specification are at T_A = 25°C and V+=3.3 V

PARAMETER			TEST CONDITIONS	MIN	TYP	MAX	UNIT
TEMPERATURE INPUT
	Range			–55		125	°C
	Accuracy (temperature error)	DGK, D	–40°C to +110°C		±0.25	±1	°C
		DGK, D	–55°C to +125°C		±0.25	±2	°C
		DSG	–40°C to +75°C		±0.25	±1	°C
		DSG	–55°C to +125°C		±0.25	±2	°C
	Accuracy (temperature error) vs. supply		PSRR			±0.03	°C/V
	Resolution		1 LSB (12 bit)		0.0625		°C
	Repeatability⁽¹⁾		25°C, V+= 3.3 V⁽²⁾		0.0625		°C
	Long-term drift⁽³⁾		500 hours at 150°C, 5.5V		0.0625		°C
DIGITAL INPUT/OUTPUT
	Input capacitance				5		pF
V_IH	High-level input logic			0.7(V+)			V
V_IL	Low-level input logic					0.3(V+)	V
I_IN	Leakage input current			–0.25	0	0.25	μA
	Input voltage hysteresis		SCL and SDA pins		600		mV
V_OL	Low-level output logic		I_OL = -3 mA, SDA and ALERT pins	0	0.15	0.4	V
	ADC Conversion time		one-shot mode	4.5	5.5	7	ms
T_C	Conversion Time		R1 = 0, R0 = 0 (default)		27.5		ms
			R1 = 0, R0 = 1		55
			R1 = 1, R0 = 0		110
			R1 = 1, R0 = 1		220
	Reset time		The time between reset till ADC conversion start		0.3		ms
	Conversion Rate Variation			–10	0	10	%
POWER SUPPLY
	Operating voltage range			1.7	3.3	5.5	V
I_Q	Quiescent current (serial bus inactive)		R1 = 0, R0 = 0 (default)		10	20	μA
			R1 = 0, R0 = 1		5.5	9	μA
			R1 = 1, R0 = 0		4	6
			R1 = 1, R0 = 1		2.7	4
			During 5.5 ms active conversion		52	85	μA
I_SD	Shutdown current		Serial bus active, SCL frequency = 400 kHz, A0=A1=A2=GND		13		μA
			Serial bus inactive, A0=A1=A2=SCL=SDA=V+, 25°C		0.37	0.65	μA
			Serial bus inactive, A0=A1=A2=SCL=SDA=V+		0.37	3.5	μA
	Power supply thresholds		Supply rising, Power-on Reset		1.22		V
	Power supply thresholds		Supply failing, Brown-out Detect		1.1		V

(1) Repeatability is the ability to reproduce a reading when the measured temperature is applied consecutively, under the same conditions.

(2) One-shot mode setup, 1 sample per minute for 24 hours.

(3) Long-term drift is determined using accelerated operational life testing at a junction temperature of 150°C.

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