ZHCSHX9L November 2008 – February 2019 ADC14155QML-SP
PRODUCTION DATA.
請參考 PDF 數(shù)據(jù)表獲取器件具體的封裝圖。
One time single event latch-up testing (SEL) was preformed according to EIA/JEDEC Standard, EIA/JEDEC57. The linear energy transfer threshold (LETth) shown in the Key Specifications table on the front page is the maximum LET tested. Test reports are available on the TI estore at SNAA153 and SNAA183.