PGA113
- Rail-to-Rail Input and Output
- Offset: 25 μV (Typical), 100 μV
(Maximum) - Zer? Drift: 0.35 μV/°C (Typical), 1.2 μV/°C
(Maximum) - Low Noise: 12 nV/√Hz
- Input Offset Current: ±5 nA Maximum (25°C)
- Gain Error: 0.1% Maximum (G ≥ 32),
0.3% Maximum (G > 32) - Binary Gains: 1, 2, 4, 8, 16, 32, 64, 128 (PGA112,
PGA116) - Scope Gains: 1, 2, 5, 10, 20, 50, 100, 200
(PGA113, PGA117) - Gain Switching Time: 200 ns
- 2 Channel MUX: PGA112, PGA113
10 Channel MUX: PGA116, PGA117 - Four Internal Calibration Channels
- Amplifier Optimized for Driving CDAC ADCs
- Output Swing: 50 mV to Supply Rails
- AVDD and DVDD for Mixed Voltage Systems
- IQ = 1.1 mA (Typical)
- Software and Hardware Shutdown: IQ ≤ 4 μA
(Typical) - Temperature Range: –40°C to 125°C
- SPI? Interface (10 MHz) With Daisy-Chain
Capability
The PGA112 and PGA113 devices (binary and scope gains) offer two analog inputs, a three-pin SPI interface, and software shutdown in a 10-pin, VSSOP package. The PGA116 and PGA117 (binary and scope gains) offer 10 analog inputs, a SPI interface with daisy-chain capability, and hardware and software shutdown in a 20-pin TSSOP package.
All versions provide internal calibration channels for system-level calibration. The channels are tied to GND, 0.9 VCAL, 0.1 VCAL, and VREF, respectively. VCAL, an external voltage connected to Channel 0, is used as the system calibration reference. Binary gains are: 1, 2, 4, 8, 16, 32, 64, and 128; scope gains are: 1, 2, 5, 10, 20, 50, 100, and 200.
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技術(shù)文檔
| 類型 | 標題 | 下載最新的英語版本 | 日期 | |||
|---|---|---|---|---|---|---|
| * | 數(shù)據(jù)表 | PGA11x Zer?-Drift Programmable Gain Amplifier With Mux 數(shù)據(jù)表 (Rev. C) | PDF | HTML | 2015年 11月 30日 | ||
| EVM 用戶指南 | PGA112/113EVM Users Guide (Rev. A) | 2012年 5月 17日 | ||||
| 應用手冊 | 所選封裝材料的熱學和電學性質(zhì) | 2008年 10月 16日 |
設(shè)計和開發(fā)
如需其他信息或資源,請點擊以下任一標題進入詳情頁面查看(如有)。
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| 封裝 | 引腳 | CAD 符號、封裝和 3D 模型 |
|---|---|---|
| VSSOP (DGS) | 10 | Ultra Librarian |
訂購和質(zhì)量
- RoHS
- REACH
- 器件標識
- 引腳鍍層/焊球材料
- MSL 等級/回流焊峰值溫度
- MTBF/時基故障估算
- 材料成分
- 鑒定摘要
- 持續(xù)可靠性監(jiān)測
- 制造廠地點
- 封裝廠地點