Abstract

The purpose of this study is to characterize the single-event effects (SEE) performance due to heavy-ion irradiation of the TPS7H401x-SEP. Heavy-ions with LET_EFF of 48 MeV×cm²/mg were used to irradiate seven production devices. Flux of ≈10⁵ ions/cm²/s and fluence of 10⁷ ions/cm² per run were used for the characterization. The results demonstrated that the TPS7H401x-SEP is SEL-free up to 48 MeV×cm²/mg at T = 125°C and SEB/SEGR free up to 48 MeV×cm²/mg at T = 25°C. Output signals including V_OUT (3% window), SS_TR (edge trigger at 50% below nominal) and PWRGD (edge trigger at 50% below nominal) were monitored to check for transients and SEFIs. The results showed the device is SEFI free up to 48 MeV×cm²/mg at T = 25°C. SETs are characterized and discussed at LET_EFF = 48 MeV×cm²/mg.