SFFS994 May 2025 LM251772-Q1 , LM51772-Q1
The failure mode distribution estimation for the LM51772-Q1 and LM251772-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| HO1 and HO2 or LO1 and LO2 gate drivers are stuck on | 10 |
| HO1 and HO2 or LO1 and LO2 gate drivers are stuck off | 20 |
| HO1 and HO2 or LO1 and LO2 gate drivers are Hi-Z | 3 |
| VCC1 and VCC2 LDO output voltage out of specification | 10 |
| DRV1 or nFLT false switching | 3 |
| VOUT voltage out of specification | 30 |
| Average current out of specifications | 14 |
| Digital control malfunctions or electrical parameters are out of specification | 10 |