SFFS994 May 2025 LM251772-Q1 , LM51772-Q1
This section provides functional safety failure in time (FIT) rates for the LM51772-Q1 based on two different industry-wide used reliability standards:
| FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) |
|---|---|
| Total component FIT rate | 30 |
| Die FIT rate | 5 |
| Package FIT rate | 25 |
The failure rate and mission profile information in Table 2-1 comes from the reliability data handbook IEC TR 62380 / ISO 26262 part 11:
| Table | Category | Reference FIT Rate | Reference Virtual TJ |
|---|---|---|---|
| 5 | CMOS, BICMOS ASICs analog and mixed HV >50V supply | N/A | 75°C |
The reference FIT rate and reference virtual TJ (junction temperature) in Table 2-2 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.