ZHCSBF7C August 2013 – May 2015 TPS65279
PRODUCTION DATA.
- 1 特性
- 2 應用范圍
- 3 說明
- 4 修訂歷史記錄
- 5 說明（續(xù)）
- 6 Pin Configuration and Functions
- 7 Specifications
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8 Detailed Description
- 8.1 Overview
- 8.2 Functional Block Diagram
- 8.3
Feature Description
- 8.3.1 Enable and Adjusting Undervoltage Lockout (UVLO)
- 8.3.2 Adjustable Switching Frequency and Synchronization
- 8.3.3 Soft-Start Time
- 8.3.4 Out-of-Phase Operation
- 8.3.5 Output Overvoltage Protection (OVP)
- 8.3.6 Bootstrap Voltage (BOOT) and Low Dropout Operation
- 8.3.7 Overcurrent Protection
- 8.3.8 Current Sharing Operation
- 8.3.9 Thermal Shutdown
- 8.4 Device Functional Modes
- 9 Application and Implementation
- 10Power Supply Recommendations
- 11Layout
- 12器件和文檔支持
- 13機械、封裝和可訂購信息
封裝選項
機械數據 (封裝 | 引腳)
散熱焊盤機械數據 (封裝 | 引腳)
訂購信息
12 器件和文檔支持
12.1 社區(qū)資源
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use.
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TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help solve problems with fellow engineers.
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Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and contact information for technical support.
12.2 商標
E2E is a trademark of Texas Instruments.
WEBENCH is a registered trademark of Texas Instruments.
All other trademarks are the property of their respective owners.
12.3 靜電放電警告
ESD 可能會損壞該集成電路。德州儀器 (TI) 建議通過適當的預防措施處理所有集成電路。如果不遵守正確的處理措施和安裝程序 , 可能會損壞集成電路。
ESD 的損壞小至導致微小的性能降級 , 大至整個器件故障。 精密的集成電路可能更容易受到損壞 , 這是因為非常細微的參數更改都可能會導致器件與其發(fā)布的規(guī)格不相符。