ZHCS128B May 2011 – October 2015 AMC80
PRODUCTION DATA.
- 1 特性
- 2 應(yīng)用
- 3 說明
- 4 修訂歷史記錄
- 5 Pin Configuration and Functions
- 6 Specifications
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7 Detailed Description
- 7.1 Overview
- 7.2 Functional Block Diagram
- 7.3 Feature Description
- 7.4 Programming
- 7.5
Register Map
- 7.5.1 Configuration Register
- 7.5.2 Interrupt Status Registers
- 7.5.3 Interrupt Mask Registers
- 7.5.4 Fan Divisor/RST_OUT/OS Register
- 7.5.5 OS Configuration/Temperature Resolution Register
- 7.5.6 Conversion Rate Register
- 7.5.7 Voltage/Temperature Channel Disable Register
- 7.5.8 Input Mode Register
- 7.5.9 ADC Control Register
- 7.5.10 Conversion Rate Count Register
- 7.5.11 Value Ram Register
- 8 Application and Implementation
- 9 器件和文檔支持
- 10機(jī)械、封裝和可訂購信息
封裝選項(xiàng)
機(jī)械數(shù)據(jù) (封裝 | 引腳)
- PW|24
散熱焊盤機(jī)械數(shù)據(jù) (封裝 | 引腳)
訂購信息
9 器件和文檔支持
9.1 社區(qū)資源
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use.
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TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help solve problems with fellow engineers.
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Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and contact information for technical support.
9.2 商標(biāo)
E2E is a trademark of Texas Instruments.
All other trademarks are the property of their respective owners.
9.3 靜電放電警告
ESD 可能會(huì)損壞該集成電路。德州儀器 (TI) 建議通過適當(dāng)?shù)念A(yù)防措施處理所有集成電路。如果不遵守正確的處理措施和安裝程序 , 可能會(huì)損壞集成電路。
ESD 的損壞小至導(dǎo)致微小的性能降級(jí) , 大至整個(gè)器件故障。 精密的集成電路可能更容易受到損壞 , 這是因?yàn)榉浅＜?xì)微的參數(shù)更改都可能會(huì)導(dǎo)致器件與其發(fā)布的規(guī)格不相符。
9.4 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.