4 修訂歷史記錄
Changes from B Revision (June 2018) to C Revision
- Changed 更改了安全相關(guān)認(rèn)證 項(xiàng)目符號(hào)（位于特性 部分）：將 VDE 認(rèn)證 版本從 DIN V VDE V 0884-10 (VDE V 0884-11) 更改為 DIN VDE V 0884-11，并將 IEC 60950-1 和 IEC 60065 更改為 IEC 62368-1Go
- Changed 將 DIN V VDE V 更改為 DIN VDE V（位于說(shuō)明 部分）Go
- Changed CLR and CPG values from ≥ 9 mm to ≥ 8.5 mm in Insulation Specifications tableGo
- Changed Insulation Specifications table header row from DIN V VDE V 0884-11 (VDE V 0884-11): 2017-01 to DIN VDE V 0884-11: 2017-01Go
- Changed VDE certification details in Safety-Related Certifications tableGo
- Changed Safety Limiting Values table format as per current standardGo
- Changed free air to ambient in condition statement of Switching Characteristics tableGo
- Changed 6.05 dB to 6.02 dB in Equation 3Go
- Changed input common-mode voltage from 2 V to 1.9 V for consistency with Input Bias Current vs Common-Mode Input Voltage figure in What To Do and What Not To Do sectionGo
- Changed VINx to AINx in Layout Guidelines sectionGo
- Changed Recommended Layout of the AMC1306x figure to include connection to the shunt resistor and input filter componentsGo
Changes from A Revision (July 2017) to B Revision
- Changed Reinforced Isolation Capacitor Lifetime Projection figure Go
Changes from * Revision (March 2017) to A Revision
- AMC1306E05 和 AMC1306M05 已投入生產(chǎn)Go
- Added 向第一個(gè)直流性能 子項(xiàng)目符號(hào)中添加了 ±50µV，以反映 AMC1306x05 器件的情況Go
- Changed 將第一個(gè)安全相關(guān)認(rèn)證 子項(xiàng)目符號(hào)中的標(biāo)準(zhǔn)偏差從 0884-10 更改為 0884-11Go
- Changed 將 VPEAK 從 8000 更改為 7000，將標(biāo)準(zhǔn)偏差從 0884-10 變更為 0884-11（均位于說(shuō)明 部分的第一段）Go
- Deleted Status column from Device Comparison TableGo
- Changed standard deviation from 0884-10 to 0884-11 in DIN V VDE V 0884-11 section of Insulation Specifications tableGo
- Changed standard deviation from 0884-10 to 0884-11 in Safety-Related Certifications tableGo
- Changed prevent to minimize in condition statement of Safety Limiting Values tableGo
- Added Electrical Characteristics: AMC1306x05 table Go
- Changed test conditions of Analog Inputs test conditions from (AINP – AINN) / 2 to AGND to (AINP + AINN) / 2 to AGND to include all possible conditionsGo
- Changed IIB test condition from Inputs shorted to AGND to AINP = AINN = AGND, IIB = IIBP + IIBNGo
- Added AINP = AINN = AGND to EO parameter test conditions Go
- Changed minus sign to plus or minus sign in typical specification of EG parameter Go
- Changed 10% to 90% to 90% to 10% in test conditions of tf parameter Go
- Added AMC1306x05 devices to Typical Characteristics section Go