SN74ABT377A
- State-of-the-Art EPIC-IIBTM BiCMOS Design Significantly Reduces Power Dissipation
- Latch-Up Performance Exceeds 500 mA Per JEDEC Standard JESD-17
- Typical VOLP (Output Ground Bounce) < 1 V at VCC = 5 V, TA = 25°C
- High-Drive Outputs (-32-mA IOH, 64-mA IOL)
- ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0)
- Package Options Include Plastic Small-Outline (DW), Shrink Small-Outline (DB), and Thin Shrink Small-Outline (PW) Packages, Ceramic Chip Carriers (FK), Plastic (N) and Ceramic (J) DIPs, and Ceramic Flat (W) Package
EPIC-IIB is a trademark of Texas Instruments Incorporated.
These 8-bit positive-edge-triggered D-type flip-flops with a clock (CLK) input are particularly suitable for implementing buffer and storage registers, shift registers, and pattern generators.
Data (D) input information that meets the setup time requirements
is transferred to the Q outputs on the positive-going edge of the
clock pulse if the common clock-enable (
) input is low. Clock triggering
occurs at a particular voltage level and is not directly related to
the transition time of the positive-going pulse. When the buffered
clock (CLK) input is at either the high or low level, the D-input
signal has no effect at the output. The circuits are designed to
prevent false clocking by transitions at
.
The SN54ABT377 is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ABT377A is characterized for operation from -40°C to 85°C.
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14-24-LOGIC-EVM — 采用 14 引腳至 24 引腳 D、DB、DGV、DW、DYY、NS 和 PW 封裝的邏輯產(chǎn)品通用評估模塊
14-24-LOGIC-EVM 評估模塊 (EVM) 設(shè)計(jì)用于支持采用 14 引腳至 24 引腳 D、DW、DB、NS、PW、DYY 或 DGV 封裝的任何邏輯器件。
| 封裝 | 引腳 | CAD 符號、封裝和 3D 模型 |
|---|---|---|
| PDIP (N) | 20 | Ultra Librarian |
| SOIC (DW) | 20 | Ultra Librarian |
| SOP (NS) | 20 | Ultra Librarian |
| SSOP (DB) | 20 | Ultra Librarian |
| TSSOP (PW) | 20 | Ultra Librarian |
訂購和質(zhì)量
- RoHS
- REACH
- 器件標(biāo)識
- 引腳鍍層/焊球材料
- MSL 等級/回流焊峰值溫度
- MTBF/時(shí)基故障估算
- 材料成分
- 鑒定摘要
- 持續(xù)可靠性監(jiān)測
- 制造廠地點(diǎn)
- 封裝廠地點(diǎn)