SN54F373
- Eight Latches in a Single Package
- 3-State Bus-Driving True Outputs
- Full Parallel Access for Loading
- Buffered Control Inputs
- Package Options Include Plastic Small-Outline (SOIC) and Shrink Small-Outline (SSOP) Packages, Ceramic Chip Carriers, and Plastic and Ceramic DIPs
These 8-bit latches feature 3-state outputs designed specifically for driving highly capacitive or relatively low-impedance loads. They are particularly suitable for implementing buffer registers, I/O ports, bidirectional bus drivers, and working registers.
The eight latches of the ´F373 are transparent D-type latches. While the latch-enable (LE) input is high, the Q outputs will follow the data (D) inputs. When the latch enable is taken low, the Q outputs are latched at the logic levels set up at the D inputs.
A buffered output-enable (
) input can be used to place the eight outputs in either
a normal
logic state (high or low logic levels) or a high-impedance state. In
the high-impedance state, the outputs neither load nor drive the bus
lines significantly. The high-impedance state and increased drive
provide the capability to drive bus lines without need for interface
or pullup components.
The output-enable (
)
input does not affect the internal operations of the latches. Old
data can be retained or new data can be entered while the outputs are
in the high-impedance state.
The SN74F373 is available in TI's shrink small-outline package (DB), which provides the same I/O pin count and functionality of standard small-outline packages in less than half the printed-circuit-board area.
The SN54F373 is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74F373 is characterized for operation from 0°C to 70°C.
技術(shù)文檔
| 類型 | 標(biāo)題 | 下載最新的英語版本 | 日期 | |||
|---|---|---|---|---|---|---|
| * | 數(shù)據(jù)表 | Octal Transparent D-Type Latches With 3-State Outputs 數(shù)據(jù)表 (Rev. A) | 1993年 10月 1日 |
訂購和質(zhì)量
- RoHS
- REACH
- 器件標(biāo)識
- 引腳鍍層/焊球材料
- MSL 等級/回流焊峰值溫度
- MTBF/時基故障估算
- 材料成分
- 鑒定摘要
- 持續(xù)可靠性監(jiān)測
- 制造廠地點
- 封裝廠地點