CD74HC175

正在供貨

具有復(fù)位功能的高速 CMOS 邏輯四通道 D 類觸發(fā)器

產(chǎn)品詳情

Number of channels 4 Technology family HC Supply voltage (min) (V) 2 Supply voltage (max) (V) 6 Input type Standard CMOS Output type Push-Pull Clock frequency (max) (MHz) 24 IOL (max) (mA) 5.2 IOH (max) (mA) -5.2 Supply current (max) (μA) 80 Features Balanced outputs, High speed (tpd 10-50ns), Positive input clamp diode Operating temperature range (°C) -55 to 125 Rating Catalog
Number of channels 4 Technology family HC Supply voltage (min) (V) 2 Supply voltage (max) (V) 6 Input type Standard CMOS Output type Push-Pull Clock frequency (max) (MHz) 24 IOL (max) (mA) 5.2 IOH (max) (mA) -5.2 Supply current (max) (μA) 80 Features Balanced outputs, High speed (tpd 10-50ns), Positive input clamp diode Operating temperature range (°C) -55 to 125 Rating Catalog
PDIP (N) 16 181.42 mm2 19.3 x 9.4 SOIC (D) 16 59.4 mm2 9.9 x 6
  • Common Clock and Asynchronous Reset on Four D-Type Flip-Flops
  • Positive Edge Pulse Triggering
  • Complementary Outputs
  • Buffered Inputs
  • Fanout (Over Temperature Range)
    • Standard Outputs . . . . . . . . . . . . . . . 10 LSTTL Loads
    • Bus Driver Outputs . . . . . . . . . . . . . 15 LSTTL Loads
  • Wide Operating Temperature Range . . . -55°C to 125°C
  • Balanced Propagation Delay and Transition Times
  • Significant Power Reduction Compared to LSTTL Logic ICs
  • HC Types
    • 2V to 6V Operation
    • High Noise Immunity: NIL = 30%, NIH = 30% of VCC at VCC = 5V
  • HCT Types
    • 4.5V to 5.5V Operation
    • Direct LSTTL Input Logic Compatibility, VIL = 0.8V (Max), VIH = 2V (Min)
    • CMOS Input Compatibility, Il 1μA at VOL, VOH
  • Common Clock and Asynchronous Reset on Four D-Type Flip-Flops
  • Positive Edge Pulse Triggering
  • Complementary Outputs
  • Buffered Inputs
  • Fanout (Over Temperature Range)
    • Standard Outputs . . . . . . . . . . . . . . . 10 LSTTL Loads
    • Bus Driver Outputs . . . . . . . . . . . . . 15 LSTTL Loads
  • Wide Operating Temperature Range . . . -55°C to 125°C
  • Balanced Propagation Delay and Transition Times
  • Significant Power Reduction Compared to LSTTL Logic ICs
  • HC Types
    • 2V to 6V Operation
    • High Noise Immunity: NIL = 30%, NIH = 30% of VCC at VCC = 5V
  • HCT Types
    • 4.5V to 5.5V Operation
    • Direct LSTTL Input Logic Compatibility, VIL = 0.8V (Max), VIH = 2V (Min)
    • CMOS Input Compatibility, Il 1μA at VOL, VOH

The ’HC175 and ’HCT175 are high speed Quad D-type Flip-Flops with individual D-inputs and Q, Q\ complementary outputs. The devices are fabricated using silicon gate CMOS technology. They have the low power consumption advantage of standard CMOS ICs and the ability to drive 10 LSTTL devices.

Information at the D input is transferred to the Q, Q\ outputs on the positive going edge of the clock pulse. All four Flip-Flops are controlled by a common clock (CP) and a common reset (MR\). Resetting is accomplished by a low voltage level independent of the clock. All four Q outputs are reset to a logic 0 and all four Q\ outputs to a logic 1.

The ’HC175 and ’HCT175 are high speed Quad D-type Flip-Flops with individual D-inputs and Q, Q\ complementary outputs. The devices are fabricated using silicon gate CMOS technology. They have the low power consumption advantage of standard CMOS ICs and the ability to drive 10 LSTTL devices.

Information at the D input is transferred to the Q, Q\ outputs on the positive going edge of the clock pulse. All four Flip-Flops are controlled by a common clock (CP) and a common reset (MR\). Resetting is accomplished by a low voltage level independent of the clock. All four Q outputs are reset to a logic 0 and all four Q\ outputs to a logic 1.
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CD74HC173 正在供貨 具有三態(tài)輸出的高速 CMOS 邏輯四通道 D 類觸發(fā)器 Voltage range (2V to 6V), average drive strength (8mA), average propagation delay (20ns)

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類型 標(biāo)題 下載最新的英語版本 日期
* 數(shù)據(jù)表 CD54HC175, CD74HC175, CD54HCT175, CD74HCT175 數(shù)據(jù)表 (Rev. C) 2003年 10月 13日

訂購和質(zhì)量

包含信息：
  • RoHS
  • REACH
  • 器件標(biāo)識(shí)
  • 引腳鍍層/焊球材料
  • MSL 等級(jí)/回流焊峰值溫度
  • MTBF/時(shí)基故障估算
  • 材料成分
  • 鑒定摘要
  • 持續(xù)可靠性監(jiān)測(cè)
包含信息：
  • 制造廠地點(diǎn)
  • 封裝廠地點(diǎn)

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