CD74ACT74-Q1
- Qualified for Automotive Applications
- Inputs Are TTL-Voltage Compatible
- Speed of Bipolar F, AS, and S, With Significantly Reduced Power Consumption
- Balanced Propagation Delays
- ±24-mA Output Drive Current
- Fanout to 15 F Devices
- SCR-Latchup-Resistant CMOS Process and Circuit Design
The CD74ACT74 dual positive-edge-triggered device is a D-type flip-flop.
A low level at the preset (PRE) or (CLR) clear inputs sets or resets the outputs, regardless of the levels of the other inputs. When PRE and CLR are inactive (high), data at the data (D) input meeting the setup time requirements is transferred to the outputs on the positive-going edge of the clock pulse. Clock triggering occurs at a voltage level and is not related directly to the rise time of the clock pulse. Following the hold-time interval, data at the D input can be changed without affecting the levels at the outputs.
技術(shù)文檔
設(shè)計(jì)和開(kāi)發(fā)
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14-24-LOGIC-EVM — 采用 14 引腳至 24 引腳 D、DB、DGV、DW、DYY、NS 和 PW 封裝的邏輯產(chǎn)品通用評(píng)估模塊
14-24-LOGIC-EVM 評(píng)估模塊 (EVM) 設(shè)計(jì)用于支持采用 14 引腳至 24 引腳 D、DW、DB、NS、PW、DYY 或 DGV 封裝的任何邏輯器件。
| 封裝 | 引腳 | CAD 符號(hào)、封裝和 3D 模型 |
|---|---|---|
| SOIC (D) | 14 | Ultra Librarian |
訂購(gòu)和質(zhì)量
- RoHS
- REACH
- 器件標(biāo)識(shí)
- 引腳鍍層/焊球材料
- MSL 等級(jí)/回流焊峰值溫度
- MTBF/時(shí)基故障估算
- 材料成分
- 鑒定摘要
- 持續(xù)可靠性監(jiān)測(cè)
- 制造廠(chǎng)地點(diǎn)
- 封裝廠(chǎng)地點(diǎn)