CD74ACT109

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具有設(shè)置和復(fù)位端的雙通道正邊沿觸發(fā)式 J-K 觸發(fā)器

產(chǎn)品詳情

Number of channels 2 Technology family ACT Supply voltage (min) (V) 4.5 Supply voltage (max) (V) 5.5 Input type TTL Output type Push-Pull Clock frequency (MHz) 100 Supply current (max) (μA) 80 IOL (max) (mA) 24 IOH (max) (mA) -24 Features Balanced outputs, Clear, High speed (tpd 10-50ns), Positive edge triggered, Positive input clamp diode, Preset Operating temperature range (°C) -55 to 125 Rating Catalog
Number of channels 2 Technology family ACT Supply voltage (min) (V) 4.5 Supply voltage (max) (V) 5.5 Input type TTL Output type Push-Pull Clock frequency (MHz) 100 Supply current (max) (μA) 80 IOL (max) (mA) 24 IOH (max) (mA) -24 Features Balanced outputs, Clear, High speed (tpd 10-50ns), Positive edge triggered, Positive input clamp diode, Preset Operating temperature range (°C) -55 to 125 Rating Catalog
PDIP (N) 16 181.42 mm2 19.3 x 9.4 SOIC (D) 16 59.4 mm2 9.9 x 6
  • Inputs Are TTL-Voltage Compatible
  • Speed of Bipolar F, AS, and S, With Significantly Reduced Power Consumption
  • Balanced Propagation Delays
  • ±24-mA Output Drive Current
    • Fanout to 15 F Devices
  • SCR-Latchup-Resistant CMOS Process and Circuit Design
  • Exceeds 2-kV ESD Protection Per MIL-STD-883, Method 3015

  • Inputs Are TTL-Voltage Compatible
  • Speed of Bipolar F, AS, and S, With Significantly Reduced Power Consumption
  • Balanced Propagation Delays
  • ±24-mA Output Drive Current
    • Fanout to 15 F Devices
  • SCR-Latchup-Resistant CMOS Process and Circuit Design
  • Exceeds 2-kV ESD Protection Per MIL-STD-883, Method 3015

The ’ACT109 devices contain two independent J-K\ positive-edge-triggered flip-flops. A low level at the preset (PRE)\ or clear (CLR)\ inputs sets or resets the outputs, regardless of the levels of the other inputs. When PRE\ and CLR\ are inactive (high), data at the J and K\ inputs meeting the setup-time requirements are transferred to the outputs on the positive-going edge of the clock (CLK) pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of the clock pulse. Following the hold-time interval, data at the J and K\ inputs can be changed without affecting the levels at the outputs. These versatile flip-flops can perform as toggle flip-flops by grounding K\ and tying J high. They also can perform as D-type flip-flops if J and K\ are tied together.

The ’ACT109 devices contain two independent J-K\ positive-edge-triggered flip-flops. A low level at the preset (PRE)\ or clear (CLR)\ inputs sets or resets the outputs, regardless of the levels of the other inputs. When PRE\ and CLR\ are inactive (high), data at the J and K\ inputs meeting the setup-time requirements are transferred to the outputs on the positive-going edge of the clock (CLK) pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of the clock pulse. Following the hold-time interval, data at the J and K\ inputs can be changed without affecting the levels at the outputs. These versatile flip-flops can perform as toggle flip-flops by grounding K\ and tying J high. They also can perform as D-type flip-flops if J and K\ are tied together.

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CD74HCT73 正在供貨 具有復(fù)位功能的高速 CMOS 邏輯雙通道下降沿 J-K 觸發(fā)器 Longer average propagation delay (22ns), lower average drive strength (4mA)

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類(lèi)型 標(biāo)題 下載最新的英語(yǔ)版本 日期
* 數(shù)據(jù)表 CD54ACT109, CD74ACT109 數(shù)據(jù)表 2003年 1月 24日

訂購(gòu)和質(zhì)量

包含信息:
  • RoHS
  • REACH
  • 器件標(biāo)識(shí)
  • 引腳鍍層/焊球材料
  • MSL 等級(jí)/回流焊峰值溫度
  • MTBF/時(shí)基故障估算
  • 材料成分
  • 鑒定摘要
  • 持續(xù)可靠性監(jiān)測(cè)
包含信息:
  • 制造廠地點(diǎn)
  • 封裝廠地點(diǎn)

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