CD4517B
- Low quiescent current - 10 nA/pkg (typ.) at VDD = 5 V
- Clock frequency 12 MHz (typ.) at VDD = 10 V
- Schmitt trigger clock inputs allow operation with very slow clock rise and fall times
- Capable of driving two low-power TTL loads, one low-power Schottky TTL load, or two HTL loads
- Three-state outputs
- 100% tested for quiescent current at 20 V
- Standardized, symmetrical output characteristics
- 5-V, 10-V and 15-V parametric ratings
- Meets all requirements of JEDEC Tentative Standard No. 13B, "Standard Specifications for Description of 'B' Series CMOS Devices"
- Applications:
Time-delay circuits
Scratch-pad memories
General-purpose serial shift-register applications
CD4517B dual 64-stage static shift register consists of two independent registers each having a clock, data, and write enable input and outputs accessible at taps following the 16th, 32nd, 48th, and 64th stages. These taps also serve as input points allowing data to be inputted at the 17th, 33rd, and 49th stages when the write enable input is a logic 1 and the clock goes through a low-to-high transition. The truth table indicates how the clock and write enable inputs control the operation of the CD4517B. Inputs at the intermediate taps allow entry of 64 bits into the register with 16 clock pulses. The 3-state outputs permit connection of this device to an external bus.
The CD4517B is supplied in 16-lead hermetic dual-in-line ceramic packages (D and F suffixes), 16-lead dual-in-line plastic packages (E suffix), and in chip form (H suffix).
技術(shù)文檔
| 類型 | 標題 | 下載最新的英語版本 | 日期 | |||
|---|---|---|---|---|---|---|
| * | 數(shù)據(jù)表 | CMOS Dual 64-Stage Static Shift Register 數(shù)據(jù)表 | 1998年 11月 21日 | |||
| 應(yīng)用手冊 | Power-Up Behavior of Clocked Devices (Rev. B) | PDF | HTML | 2022年 12月 15日 | |||
| 選擇指南 | Logic Guide (Rev. AB) | 2017年 6月 12日 | ||||
| 應(yīng)用手冊 | Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) | 2015年 12月 2日 | ||||
| 選擇指南 | 邏輯器件指南 2014 (Rev. AA) | 最新英語版本 (Rev.AC) | PDF | HTML | 2014年 11月 17日 | ||
| 用戶指南 | LOGIC Pocket Data Book (Rev. B) | 2007年 1月 16日 | ||||
| 應(yīng)用手冊 | Semiconductor Packing Material Electrostatic Discharge (ESD) Protection | 2004年 7月 8日 | ||||
| 用戶指南 | Signal Switch Data Book (Rev. A) | 2003年 11月 14日 | ||||
| 應(yīng)用手冊 | Understanding Buffered and Unbuffered CD4xxxB Series Device Characteristics | 2001年 12月 3日 | ||||
| 選擇指南 | Logic Guide (Rev. AC) | PDF | HTML | 1994年 6月 1日 |
設(shè)計和開發(fā)
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14-24-LOGIC-EVM — 采用 14 引腳至 24 引腳 D、DB、DGV、DW、DYY、NS 和 PW 封裝的邏輯產(chǎn)品通用評估模塊
14-24-LOGIC-EVM 評估模塊 (EVM) 設(shè)計用于支持采用 14 引腳至 24 引腳 D、DW、DB、NS、PW、DYY 或 DGV 封裝的任何邏輯器件。
| 封裝 | 引腳 | CAD 符號、封裝和 3D 模型 |
|---|---|---|
| PDIP (N) | 16 | Ultra Librarian |
訂購和質(zhì)量
- RoHS
- REACH
- 器件標識
- 引腳鍍層/焊球材料
- MSL 等級/回流焊峰值溫度
- MTBF/時基故障估算
- 材料成分
- 鑒定摘要
- 持續(xù)可靠性監(jiān)測
- 制造廠地點
- 封裝廠地點