CD4014B
- Medium speed operation…12 MHz (typ.) clock rate at VDD – VSS = 10 V
- Fully static operation
- 8 master-slave flip-flops plus output buffering and control gating
- 100% tested for quiescent current at 20 V
- Maximum input current of 1 μA at 18 V over full package-temperature range; 100 nA at 18 V and 25°C
- Noise margin (full package-temperature range) =
1 V at VDD = 5 V
2 V at VDD = 10 V
2.5 V at VDD = 15 V - Standardized, symmetrical output characteristics
- 5-V, 10-V, and 15-V parametric ratings
- Meets all requirements of JEDEC Tentative Standard No. 13B, "Standard Specifications for Description of ’B’ Series CMOS Devices"
- Applications:
- Parallel input/serial output data queueing
- Parallel to serial data conversion
- General-purpose register
Data sheet acquired from Harris Semiconductor
CD4014B and CD4021B series types are 8-stage parallel- or serial-input/serial output registers having common CLOCK and PARALLEL/SERIAL CONTROL inputs, a single SERIAL data input, and individual parallel "JAM" inputs to each register stage. Each register stage is D-type, master-slave flip-flop. In addition to an output form stage 8, "Q" outputs are also available from stages 6 and 7. Parallel as well as serial entry is made into the register synchronously with the positive clock line transition in the CD4014B. In the CD4021B serial entry is synchronous with the clock by parallel entry is asynchronous. In both types, entry is controlled by the PARALLEL/SERIAL CONTROL input. When the PARALLEL/SERIAL CONTROL input is low, data is serially shifted into the 8-stage register synchronously with the positive transition of the clock line. When the PARALLEL/SERIAL CONTROL input is high, data is jammed into the 8-stage register via the parallel input lines and synchronous with the positive transition of the clock line. In the CD4021B, the CLOCK input of the internal stage is "forced" when asynchronous parallel entry is made. Register expansion using multiple packages is permitted.
The CD4014B and CD4021B series types are supplied in 16-lead hermetic dual-in-line ceramic packages (F3A suffix), 16-lead dual-in-line plastic packages (E suffix), 16-lead small-outline packages (M, M96, MT, and NSR suffixes), and 16-lead thin shrink small-oultine packages (PW and PWR suffixes).
技術(shù)文檔
| 類型 | 標(biāo)題 | 下載最新的英語(yǔ)版本 | 日期 | |||
|---|---|---|---|---|---|---|
| * | 數(shù)據(jù)表 | CD4014B, CD4021B TYPES 數(shù)據(jù)表 (Rev. C) | 2003年 10月 13日 | |||
| 應(yīng)用手冊(cè) | Power-Up Behavior of Clocked Devices (Rev. B) | PDF | HTML | 2022年 12月 15日 | |||
| 選擇指南 | Logic Guide (Rev. AB) | 2017年 6月 12日 | ||||
| 應(yīng)用手冊(cè) | Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) | 2015年 12月 2日 | ||||
| 選擇指南 | 邏輯器件指南 2014 (Rev. AA) | 最新英語(yǔ)版本 (Rev.AC) | PDF | HTML | 2014年 11月 17日 | ||
| 用戶指南 | LOGIC Pocket Data Book (Rev. B) | 2007年 1月 16日 | ||||
| 應(yīng)用手冊(cè) | Semiconductor Packing Material Electrostatic Discharge (ESD) Protection | 2004年 7月 8日 | ||||
| 用戶指南 | Signal Switch Data Book (Rev. A) | 2003年 11月 14日 | ||||
| 應(yīng)用手冊(cè) | Understanding Buffered and Unbuffered CD4xxxB Series Device Characteristics | 2001年 12月 3日 | ||||
| 選擇指南 | Logic Guide (Rev. AC) | PDF | HTML | 1994年 6月 1日 |
設(shè)計(jì)和開發(fā)
如需其他信息或資源,請(qǐng)點(diǎn)擊以下任一標(biāo)題進(jìn)入詳情頁(yè)面查看(如有)。
14-24-LOGIC-EVM — 采用 14 引腳至 24 引腳 D、DB、DGV、DW、DYY、NS 和 PW 封裝的邏輯產(chǎn)品通用評(píng)估模塊
14-24-LOGIC-EVM 評(píng)估模塊 (EVM) 設(shè)計(jì)用于支持采用 14 引腳至 24 引腳 D、DW、DB、NS、PW、DYY 或 DGV 封裝的任何邏輯器件。
| 封裝 | 引腳 | CAD 符號(hào)、封裝和 3D 模型 |
|---|---|---|
| PDIP (N) | 16 | Ultra Librarian |
| SOIC (D) | 16 | Ultra Librarian |
| TSSOP (PW) | 16 | Ultra Librarian |
訂購(gòu)和質(zhì)量
- RoHS
- REACH
- 器件標(biāo)識(shí)
- 引腳鍍層/焊球材料
- MSL 等級(jí)/回流焊峰值溫度
- MTBF/時(shí)基故障估算
- 材料成分
- 鑒定摘要
- 持續(xù)可靠性監(jiān)測(cè)
- 制造廠地點(diǎn)
- 封裝廠地點(diǎn)