SFFSAD4 May 2025 TLV3511-Q1
1 Overview
This document contains information for the following devices to aid in a functional safety system design:
| TLV3511-Q1 |
|---|
| SOT-23 (5) |
| SC70 (5) |
| TLV3512-Q1 |
|---|
| VSSOP (8) |
Information provided are:
- Functional safety failure in time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
- Component failure modes and distribution (FMD) based on the primary function of the device
- Pin failure mode analysis (pin FMA)
Figure 1-1 shows the device functional block diagram for reference.
Figure 1-1 Functional Block
DiagramThe TLV351x-Q1 family was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.