SBOK084 December 2023 SN54SC3T97-SEP , SN54SC3T98-SEP , SN54SC4T00-SEP , SN54SC4T02-SEP , SN54SC4T125-SEP , SN54SC4T32-SEP , SN54SC4T86-SEP
PRODUCTION DATA
3 Test Device and Test Board Information
The SN54SC4T125-SEP is a packaged 14-pin, TSSOP plastic package shown in Figure 3-1 . Figure 3-2 shows the device with the package cap decapped to reveal the die for heavy ion testing. Figure 3-3 shows the evaluation board used for radiation testing. Figure 3-4 shows the bias diagram used for Single-Event Latch-up (SEL) testing.
Figure 3-1 SN54SC4T125-SEP Pinout
Diagram
Figure 3-2 Photo of SN54SC4T125-SEP
Package Decapped
Figure 3-3 SN54SC4T125-SEP Evaluation
Board (Top View)
Figure 3-4 SN54SC4T125-SEP SEL Bias Diagram
Figure 3-5 SN54SC4T125-SEP Thermal Image for SEL