ZHCSJ74A December 2018 – January 2020 TCAN4550
PRODUCTION DATA.
NOTE
All TXD_INT, RXD_INT and EN_INT references are for internal nodes that represent the same functions for a physical layer transceiver. In test mode these can be brought out to pins to test the transceiver or CAN FD controller.
Figure 3. Bus States (Physical Bit Representation)
Figure 4. Simplified Recessive Common Mode Bias Unit and Receiver NOTE
A: Classic CAN and CAN FD modes
B: Standby and Sleep Modes (Low Power)
Figure 5. Supply Test Circuit
Figure 6. Driver Test Circuit and Measurement
Figure 7. Receiver Test Circuit and Measurement
Figure 8. Transmitter and Receiver Timing Behavior Test Circuit and Measurement
Figure 9. TXD_INT Dominant Timeout Test Circuit and Measurement
Figure 10. Driver Short-Circuit Current Test and Measurement
Figure 11. tWAKE While Monitoring INH Output
Figure 12. Test Signal Definition for Bias Reaction Time Measurement
Figure 13. SPI AC Characteristic Write
Figure 14. SPI AC Characteristic Read
Figure 16. Sleep to Standby Timing
Figure 17. Normal to Sleep Timing
Figure 18. Normal to Standby Timing