ZHCSBN6A September 2013 – November 2015 SN65HVD265 , SN65HVD266 , SN65HVD267
PRODUCTION DATA.
- 1 特性
- 2 應(yīng)用
- 3 （說(shuō)明
- 4 Revision History
- 5 Device Comparison Table
- 6 Pin Configurations and Functions
- 7 Specifications
- 8 Parameter Measurement Information
- 9 Detailed Description
- 10Application and Implementation
- 11Power Supply Recommendations
- 12Layout
- 13器件和文檔支持
- 14機(jī)械、封裝和可訂購(gòu)信息
封裝選項(xiàng)
機(jī)械數(shù)據(jù) (封裝 | 引腳)
- D|8
散熱焊盤機(jī)械數(shù)據(jù) (封裝 | 引腳)
訂購(gòu)信息
8 Parameter Measurement Information
Figure 2. RXD Dominant Timeout Test Circuit and Measurement
Figure 3. FAULT Test and Measurement
Figure 4. Driver Test Circuit and Measurement
Figure 5. Receiver Test Circuit and Measurement
Figure 6. tMODE Test Circuit and Measurement
Table 1. Receiver Differential Input Voltage Threshold Test
| INPUT | OUTPUT | |||
|---|---|---|---|---|
| VCANH | VCANL | |VID| | RXD | |
| -1.1V | -2.0 V | 900 mV | L | VOL |
| 7.0 V | 6.1 V | 900 mV | L | |
| -1.5 V | -2.0 V | 500 mV | H | VOH |
| 7.0 V | 6.5 V | 500 mV | H | |
| Open | Open | X | H | |
Figure 7. TPROP(LOOP) Test Circuit and Measurement
Note: tLOOP is equivalent to tPROP(LOOP) from CAN timing.
Figure 8. Loop Delay Symmetry Test Circuit and Measurement
Figure 9. TXD Dominant Timeout Test Circuit and Measurement
Figure 10. Driver Short Circuit Current Test and Measurement