SDLS146B October 1976 – September 2016 SN54LS245 , SN74LS245
請(qǐng)參考 PDF 數(shù)據(jù)表獲取器件具體的封裝圖。
| MIN | MAX | UNIT | |||
|---|---|---|---|---|---|
| VCC | Supply voltage | 7 | V | ||
| VI | Input voltage(1) | 7 | V | ||
| TJ | Operating virtual junction temperature | 150 | °C | ||
| Tstg | Storage temperature | –65 | 150 | °C | |
| VALUE | UNIT | |||
|---|---|---|---|---|
| V(ESD) | Electrostatic discharge | Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) | ±2500 | V |
| Charged-device model (CDM), per JEDEC specification JESD22-C101(2) | ±1500 | |||
| MIN | NOM | MAX | UNIT | |||
|---|---|---|---|---|---|---|
| VCC | Supply voltage | SN54LS245 | 4.5 | 5 | 5.5 | V |
| SN74LS245 | 4.75 | 5 | 5.25 | |||
| IOH | High-level output current | SN54LS245 | –12 | mA | ||
| SN74LS245 | –15 | |||||
| IOL | Low-level output current | SN54LS245 | 12 | mA | ||
| SN74LS245 | 24 | |||||
| TA | Operating free-air temperature | SN54LS245 | –55 | 125 | °C | |
| SN74LS245 | 0 | 70 | ||||
| THERMAL METRIC(1) | SNx4LS245 | UNIT | |||||||
|---|---|---|---|---|---|---|---|---|---|
| J (CDIP) |
W (CFP) |
FK (LCCC) |
DB (SSOP) |
DW (SOIC) |
N (PDIP) |
NS (SO) |
|||
| 20 PINS | 20 PINS | 20 PINS | 20 PINS | 20 PINS | 20 PINS | 20 PINS | |||
| RθJA | Junction-to-ambient thermal resistance | N/A | N/A | N/A | 91.7 | 79.0 | 46.1 | 74.2 | °C/W |
| RθJC(top) | Junction-to-case (top) thermal resistance | 42.3(2) | 70.1(2) | 46.7(2) | 53.1 | 44.4 | 32.1 | 40.4 | °C/W |
| RθJB | Junction-to-board thermal resistance | 56.9(2) | 109.5(2) | 45.6(2) | 46.8 | 46.9 | 27.0 | 41.7 | °C/W |
| ψJT | Junction-to-top characterization parameter | N/A | N/A | N/A | 18.9 | 18.0 | 17.6 | 16.9 | °C/W |
| ψJB | Junction-to-board characterization parameter | N/A | N/A | N/A | 46.4 | 46.3 | 26.9 | 41.3 | °C/W |
| RθJC(bot) | Junction-to-case (bottom) thermal resistance | 15.9(2) | 13.0(2) | 6.7(2) | N/A | N/A | N/A | N/A | °C/W |
| PARAMETER | TEST CONDITIONS(1) | MIN | TYP(1) | MAX | UNIT | ||||
|---|---|---|---|---|---|---|---|---|---|
| VIH | High-level input voltage | 2 | V | ||||||
| VIL | Low-level input voltage | SN54LS245 | 0.7 | V | |||||
| SN74LS245 | 0.8 | ||||||||
| VIK | Input clamp voltage | VCC = MIN, | II = –18 mA | –1.5 | V | ||||
| Hysteresis (VT+ – VT–) |
A or B | VCC = MIN | 0.2 | 0.4 | V | ||||
| VOH | High-level output voltage | VCC = MIN, VIL = VIL(max) VIH = 2 V, |
IOH = –3 mA | 2.4 | 3.4 | V | |||
| IOH = MAX | 2 | ||||||||
| VOL | Low-level output voltage | VCC = MIN, VIH = 2 V, VIL = VIL(max) |
IOL = 12 mA | 0.4 | V | ||||
| IOL = 24 mA | SN74LS245 | 0.5 | |||||||
| IOZH | Off-state output current, high-level voltage applied |
VCC = MAX, OE at 2 V |
VO = 2.7 V | 20 | µA | ||||
| IOZL | Off-state output current, low-level voltage applied |
VCC = MAX, OE at 2 V |
VO = 0.4 V | –200 | µA | ||||
| II | Input current at maximum input voltage |
A or B | VCC = MAX | VI = 5.5 V | 0.1 | mA | |||
| DIR or OE | VI = 7 V | 0.1 | |||||||
| IIH | High-level input current | VCC = MAX, | VIH = 2.7 V | 20 | µA | ||||
| IIL | Low-level input current | VCC = MAX, | VIL = 0.4 V | –0.2 | mA | ||||
| IOS | Short-circuit output current(2) | VCC = MAX | –40 | –225 | mA | ||||
| ICC | Supply current | Total, outputs high |
VCC = MAX | Outputs open | 48 | 70 | mA | ||
| Total, outputs low |
62 | 90 | |||||||
| Outputs at high Z |
64 | 95 | |||||||
| PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
|---|---|---|---|---|---|---|---|
| tPLH | Propagation delay time, low- to high-level output | CL = 45 pF, RL = 667 Ω | 8 | 12 | ns | ||
| tPHL | Propagation delay time, high- to low-level output | 8 | 12 | ||||
| tPZL | Output enable time to low level | CL = 45 pF, RL = 667 Ω | 27 | 40 | ns | ||
| tPZH | Output enable time to high level | 25 | 40 | ||||
| tPLZ | Output disable time from low level | CL = 5 pF, RL = 667 Ω | 15 | 25 | ns | ||
| tPHZ | Output disable time from high level | 15 | 28 | ||||
Figure 1. Simulated Propagation Delay From Input to Output