SNIS146B March 2007 – October 2017 LM95214
PRODUCTION DATA.
| MIN | MAX | UNIT | ||
|---|---|---|---|---|
| Supply voltage | –0.3 | 6 | V | |
| Voltage at SMBDAT, SMBCLK, TCRIT1, TCRIT2, TCRIT3 |
–0.5 | 6 | V | |
| Voltage at other pins | –0.3 | VDD + 0.3 | V | |
| D− Input current | ±1 | mA | ||
| Input current at all other pins (2) | ±5 | mA | ||
| Package input current (2) | 30 | mA | ||
| SMBDAT, TCRIT1, TCRIT2, TCRIT3 output sink current |
10 | mA | ||
| Storage temperature, Tstg | –65 | 150 | °C | |
| VALUE | UNIT | |||
|---|---|---|---|---|
| V(ESD) | Electrostatic discharge(3) | Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) | ±2000 | V |
| Charged-device model (CDM), per JEDEC specification JESD22-C101(2) | ±1000 | |||
| Machine Model | ±200 | |||
| MIN | NOM | MAX | UNIT | ||
|---|---|---|---|---|---|
| Operating temperature | –40 | 140 | °C | ||
| Supply voltage (VDD) | 3 | 3.6 | V | ||
| THERMAL METRIC(1) | LM95214 | UNIT | |
|---|---|---|---|
| NHL (WSON) | |||
| 14 PINS | |||
| RθJA | Junction-to-ambient thermal resistance | 38.7 | °C/W |
| RθJC(top) | Junction-to-case (top) thermal resistance | 27.5 | °C/W |
| RθJB | Junction-to-board thermal resistance | 16.7 | °C/W |
| ψJT | Junction-to-top characterization parameter | 0.3 | °C/W |
| ψJB | Junction-to-board characterization parameter | 16.6 | °C/W |
| RθJC(bot) | Junction-to-case (bottom) thermal resistance | 3.2 | °C/W |
| PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
|---|---|---|---|---|---|---|---|
| Temperature error using local diode | TA = –40°C to +125°C, (1) | –2 | ±1 | +2 | °C | ||
| Temperature error using an MMBT3904 transistor remote diode(2) | TA = +25°C to +85°C TD = +60°C to +100°C |
–1.1 | +1.1 | °C | |||
| TA = +25°C to +85°C TD = –40°C to +125°C |
–1.3 | +1.3 | °C | ||||
| TA = –40°C to +85°C TD = –40°C to +125°C |
–3 | +3 | °C | ||||
| TA = –40°C to +85°C TD = 125°C to +140°C |
–3.3 | +3.3 | °C | ||||
| Local diode measurement resolution | 11 | Bits | |||||
| 0.125 | °C | ||||||
| Remote diode measurement resolution | Digital filter off | 11 | Bits | ||||
| 0.125 | °C | ||||||
| Digital filter on (Remote Diodes 1 and 2 only) | 13 | Bits | |||||
| 0.03125 | °C | ||||||
| Conversion time of all temperatures at the fastest setting(4) | All channels are enabled in default state | 1100 | 1210 | ms | |||
| 1 external channel | 31 | 34 | ms | ||||
| Local only | 30 | 33 | ms | ||||
| Quiescent current (3) | SMBus inactive, 1-Hz conversion rate, channels in default state | 570 | 800 | µA | |||
| Shutdown | 360 | µA | |||||
| D− Source voltage | 0.4 | V | |||||
| Remote diode source current | High level | 160 | 230 | µA | |||
| Low level | 10 | ||||||
| Power-On reset threshold | Measured on VDD input, falling edge | 1.6 | 2.8 | V | |||
| TCRIT1 pin temperature threshold | Default diodes 1 and 2 only | 110 | °C | ||||
| TCRIT2 pin temperature threshold | Default all channels | 85 | °C | ||||
| TCRIT3 pin temperature threshold | Default diodes 3 and 4 only | 85 | °C | ||||
| PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
|---|---|---|---|---|---|---|---|
| SMBDAT, SMBCLK INPUTS | |||||||
| VIN(1) | Logical 1 input voltage | 2.1 | V | ||||
| VIN(0) | Logical 0 input voltage | 0.8 | V | ||||
| VIN(HYST) | SMBDAT and SMBCLK digital input hysteresis | 400 | mV | ||||
| IIN(1) | Logical 1 input current | VIN = VDD | 0.005 | 10 | µA | ||
| IIN(0) | Logical 0 input current | VIN = 0 V | −0.005 | –10 | µA | ||
| CIN | Input capacitance | 5 | pF | ||||
| A0 DIGITAL INPUT | |||||||
| VIH | Input high voltage | 0.90 × VDD | V | ||||
| VIM | Input middle voltage | 0.43 × VDD | 0.57 × VDD | V | |||
| V | |||||||
| VIL | Input low voltage | 0.10 × VDD | V | ||||
| IIN(1) | Logical 1 input current | VIN = VDD | VIN = VDD | –0.005 | –10 | µA | |
| IIN(0) | Logical 0 input current | VIN = 0 V | VIN = 0 V | 0.005 | 10 | µA | |
| CIN | Input capacitance | 5 | pF | ||||
| SMBDAT, TCRIT1, TCRIT2, TCRIT3 DIGITAL OUTPUTS | |||||||
| IOH | High level output current | VOH = VDD | 10 | µA | |||
| VOL(SMBDAT) | SMBus low level output voltage | IOL = 4 mA | 0.4 | V | |||
| IOL = 6 mA | 0.6 | V | |||||
| VOL(TCRIT) | TCRIT1, TCRIT2, TCRIT3 low level output voltage | IOL = 6 mA | 0.4 | V | |||
| COUT | Digital output capacitance | 5 | pF | ||||
| PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
|---|---|---|---|---|---|---|---|
| fSMB | SMBus clock frequency | 10 | 100 | kHz | |||
| tLOW | SMBus clock low time | from VIN(0)max to VIN(0)max | 4.7 | µs | |||
| 25 | ms | ||||||
| tHIGH | SMBus clock high time | from VIN(1)min to VIN(1)min | 4.0 | µs | |||
| tR,SMB | SMBus rise time | See (1) | 1 | µs | |||
| tF,SMB | SMBus fall time | See (2) | 0.3 | µs | |||
| tOF | Output fall time | CL = 400 pF, IO = 3 mA(2) |
250 | ns | |||
| tTIMEOUT | SMBDAT and SMBCLK time low for reset of serial interface | 25 | 35 | ms | |||
| tSU;DAT | Data in setup time to SMBCLK high | 250 | ns | ||||
| tHD;DAT | Data out stable after SMBCLK low | 300 | 1075 | ns | |||
| tHD;STA | Start condition SMBDAT low to SMBCLK low (Start condition hold before the first clock falling edge) | 100 | ns | ||||
| tSU;STO | Stop condition SMBCLK high to SMBDAT low (Stop condition setup) | 100 | ns | ||||
| tSU;STA | SMBus repeated start-condition setup time, SMBCLK high to SMBDAT low | 0.6 | µs | ||||
| tBUF | SMBus free time between stop and start conditions | 1.3 | µs | ||||
Figure 1. SMBus Communication
Figure 2. Conversion Rate Effect on Average Power Supply Current
Figure 4. Remote Temperature Reading Sensitivity to Thermal Diode Filter Capacitance
Figure 6. Remote 1 Temperature Error, TA = TD
Figure 8. Remote 3 Temperature Error, TA = TD
Figure 3. Thermal Diode Capacitor or PCB Leakage Current Effect on Remote Diode Temperature Reading
Figure 5. Local Temperature Error, TA = TD
Figure 7. Remote 2 Temperature Error, TA = TD
Figure 9. Remote 4 Temperature Error, TA = TD