1 Overview

This document contains information for LM60430-Q1 and LM60440-Q1 (WQFN-HR package) to aid in a functional safety system design. Information provided are:

• Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
• Component failure modes and their distribution (FMD) based on the primary function of the device
• Pin failure mode analysis (Pin FMA)

Figure 1-1 show the device functional block diagrams for reference.

LM60430-Q1 and LM60440-Q1 were developed using a quality-managed development process, but were not developed in accordance with the ISO 26262 standards.