SCAS877F May 2009 – January 2016 CDCLVP1216
PRODUCTION DATA.
Figure 5 through Figure 11 show how the device should be set up for a variety of test configurations.
Figure 6. DC-Coupled LVCMOS Input During Device Test
Figure 7. Vth Variation over LVCMOS Vth Levels
Figure 8. DC-Coupled LVDS Input During Device Test
Figure 10. LVPECL Output DC Configuration During Device Test
Figure 11. LVPECL Output AC Configuration During Device Test