SCAS890E October 2009 – November 2015 CDCLVP1208
PRODUCTION DATA.
Figure 5 through Figure 11 illustrate how the device should be set up for a variety of test configurations.
Figure 5. DC-Coupled LVPECL Input During Device Test
Figure 6. DC-Coupled LVCMOS Input During Device Test
Figure 7. Vth Variation over LVCMOS Vth Levels
Figure 8. DC-Coupled LVDS Input During Device Test
Figure 9. AC-Coupled Differential Input to Device
Figure 10. LVPECL Output DC Configuration During Device Test
Figure 11. LVPECL Output AC Configuration During Device Test